Introducing new Wave Series SWIR line scan cameras with 1K and 2K resolution and GigE Vision interface

Written by JAI | June 4, 2026

JAI is expanding its Wave Series with the introduction of two new high-performance SWIR line scan cameras: the WAL-1001-GE (1K) and WAL-2001-GE (2K). Designed for demanding industrial inspection environments, the new models combine high-sensitivity short-wave infrared imaging with a GigE Vision interface, enabling efficient data transfer and straightforward system integration.

Built to deliver reliable performance in challenging imaging conditions, the cameras support accurate defect detection, subsurface inspection, and material differentiation across a wide range of machine vision applications.

WAL-1001-GE – 1K SWIR line scan camera:

✔ 1 × 1024-pixel resolution
✔ Up to 29 kHz line rate (29,000 lines/second)
✔ Large 12.5 µm × 12.5 µm pixels
✔ GigE Vision interface

WAL-2001-GE – 2K SWIR line scan camera:

✔ 2K resolution (pixel-shift)
✔ Up to 40 kHz line rate (40,000 lines/second)
✔ Large 12.5 µm × 12.5 µm pixels
✔ GigE Vision interface

High sensitivity and flexible image output

Both camera models are built around large 12.5 µm × 12.5 µm pixels, delivering a high signal-to-noise ratio and excellent infrared response. This enables reliable imaging even in low-light environments or at high inspection speeds. With a peak quantum efficiency of up to 83%, the cameras provide high sensitivity across the SWIR spectrum without compromising image quality.

Support for Mono 8-, 10-, 12-, and 14-bit output allows precise intensity representation, smoother grayscale transitions, and improved measurement accuracy in demanding inspection applications.

Optimized performance for industrial inspection

WAL-1001-GE
The WAL-1001-GE features a 12.8 mm-wide SWIR sensor with large 12.5 µm square pixels, combined with a GigE Vision interface and standard C-mount. Supporting line rates of up to 29 kHz, it offers an ideal balance between sensitivity, image quality, and throughput for a wide range of inspection systems.

WAL-2001-GE
The WAL-2001-GE extends performance with higher resolution and faster line rates of up to 40 kHz. It utilizes a dual-line architecture (2 × 1024 pixels) with a 0.5-pixel offset to increase sampling density. . Combined with operation at double the line rate, this results in an equivalent pixel size of 6.25 µm × 6.25 µm and nearly doubles the resolution compared to conventional 1K line scan cameras.

This design enables reliable detection of sub-pixel-scale defects. Image synthesis is performed in real time within the camera, eliminating the need for external acquisition hardware. This simplifies system architecture, reduces latency, and allows a straightforward upgrade from 1K to 2K resolution without changes to optics, lighting, or working distance.

Designed for a wide range of applications

The new Wave Series SWIR line scan cameras provide high-performance imaging across a broad range of industrial inspection tasks:

	Fruit and vegetable sorting and grading Detect moisture, contamination, and foreign materials while enabling grading based on bruising, ripeness, or early mold development. SWIR imaging also enables differentiation between visually similar products.
	Wafer inspection Reveal subsurface cracks caused by thermal stress, inspect coatings and residues, perform edge inspection, and enable precise wafer alignment by visualizing features through silicon.
	Recycling Identify and separate plastics such as PET, PE, PP, and PS on high-speed conveyors. SWIR contrast also enables detection of black and dark plastics that are difficult to distinguish with visible or near-infrared imaging.
	Pharmaceutical and fill level inspection Enable continuous inspection of vials, ampoules, and blister packaging on high-speed production lines, supporting reliable fill-level verification and detection of missing or defective products.
	Plastic seal inspection Provides reliable verification of heat-seal width, seal consistency, and seal strength in transparent or opaque packaging, while identifying seal defects, including bubbles, wrinkles, and improper sealing, as well as detecting closure strips and other features that are difficult to identify with visible-light imaging.

Reliable design and easy integration

With a 12.8 mm sensor width, both cameras support standard C-mount optics, ensuring compatibility with a wide range of lenses and simplifying system integration. As with all JAI cameras, the new Wave models are built using advanced low-noise designs and high-quality components, and undergo extensive thermal, shock, and vibration testing to ensure long-term reliability in industrial environments.

Expanding the Wave Series

In addition to the new line scan models, the Wave Series will soon expand with a new SWIR area scan camera offering 1.3 MP resolution. This upcoming model will further extend SWIR imaging capabilities to a wider range of applications.

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